Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel

A method for inspecting a circuit panel having a plurality of substantially parallel, conductive lines and a built-in shorting means coupled to alternate conductive lines, the method comprising the steps of:

• applying a second shorting means across a plurality of conductive lines to short said plurality of conductive lines;
• applying a first test signal to either one of the built-in shorting means and the second shorting means;
• capturing a capacitance image of a first area of the panel;
• identifying an open circuit line defect from the capacitance image;
• identifying a location of said open circuit line defect;
• and
• storing said location and a corresponding indication signifying an open circuit line defect.

An apparatus for automatically inspecting and repairing a simple matrix circuit panel, said panel having a plurality of substantially parallel conductive lines and a built-in shorting bar coupled to alternate conductive lines, comprising:

• means for applying a test signal to said built-in shorting bar;
• means for capturing a capacitance image of a portion of said panel while said test signal is applied;
• means for identifying panel defects from said captured image;
• means for storing panel defect information including defect type data and defect location data;
• laser means for removing selective material from a location of said panel, said selective material and said location determined based upon said panel defect information;
• and
• means for forming a conductive line to repair the panel defect.

A method for automatically testing and repairing a circuit panel, comprising the steps of:

• applying a test signal to said circuit panel;
• capturing a capacitance image of said panel while said test signal is applied;
• identifying panel defects from said captured image;
• storing panel defect information including defect type data and defect location data;
• removing selective material from a location of said panel, said selective material and said location being determined from said panel defect information;
• dispensing a film layer over an area of the panel which includes a panel defect;
• and
• forming a conductive line with said film to repair the panel defect.