Shielded electrical contact spring probe assembly
AssigneeInterconnect Devices, Inc.
InventorUlf R. Langgard
Life of this patent
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AssigneeInterconnect Devices, Inc.
InventorUlf R. Langgard
Estimating the term…
A shielded electrical contact spring probe assembly for testing electrical printed circuit boards includes an outer barrel having an open end and a remote end, an inner core of dielectric material coaxially mounted within the barrel, and an electrical contact spring probe reciprocally seated within an axial bore in the core. A shield surrounds the core between the barrel inner wall and the core and extends the full length of the barrel. A shielding plunger is located in a cylindrical space between the barrel and the shield. The probe assembly remote end is for connection of an electrical transmission line, or in an alternative embodiment, inserting a second electrical contact spring probe within the core. The configuration and material of the core and the shield enable the entire probe assembly to maintain a selected impedance. The electrical contact spring probe seated within the core axial bore includes a separate barrel having a spring seating end and an open end, a compression spring seated in the closed end of the barrel, and a plunger inserted into the barrel. The plunger includes a tail section, connected to a shaft or probe section that protrudes from the barrel and includes the probe tip. The shielding plunger of the assembly is spring loaded to extend outwardly surrounding the probe tip when the probe tip is also in an outwardly extended position. The plunger fits snugly against portions of a circuit board surrounding test site and shields the probe tip against emission of RF energy.
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly as claimed in claim 14 wherein each said electrical contact spring probe plunger is made from a single piece of metal.
A shielded electrical contact spring probe assembly comprising:
A shielded electrical contact spring probe assembly comprising:
Dependencies are inferred from the claim text.