US 5,175,492 A · Calibration and error correction for electrical-source-to-E/O-device impedance mismatch and O/E-device-to-electrical-receiver impedance mismatch in a lightwave component analyzer

Abstract

A lightwave component analyzer including at least an internal optical receiver and preferably also including an internal optical source which are selectively connectable by switches configurable by means of an instrument controller for calibration and performance of electro-optical, opto-electrical, and optical measurements. Transmission measurements of E/O devices are corrected for source match errors, and transmission measurements of O/E devices are corrected for load match errors, in addition to frequency response and cross-talk error correction. Response and match error correction provides for improved measurements of test devices with an electrical port having an impedance different from that of the measurement system impedance.

Claims20

Dependent claims

A method for electrical-source-to-E/O-device impedance mismatch calibration in a lightwave component analyzer, comprising the steps of:

(a) measuring electrical response data for a short on a first electrical test port of the lightwave component analyzer;
(b) measuring electrical response data for an open on the first electrical test port;
(c) measuring electrical response data for a load on the first electrical test port;
calculating forward source match (Esf), forward reflection tracking (Erf), and forward directivity (Edf) using the response data measured during steps (a), (b), and (c);
(d) measuring electrical isolation response data, which is used as Exf;
(e) measuring electrical and optical response data for respective electrical and optical through connections connected across the first and a second electrical test port of the lightwave component analyzer and first and second optical test ports of the lightwave component analyzer, respectively, which are used to calculate transmission tracking (Etf);
and
using the response data for calculating error correction data to obtain a calibrated measurement on an E/O device.

5 more elements

A method for O/E-device-to-electrical-receiver impedance mismatch calibration in a lightwave component analyzer, comprising the steps of:

(a) measuring electrical response data for a short on a first electrical test port of the lightwave component analyzer;
(b) measuring electrical response data for an open on the first electrical test port;
(c) measuring electrical response data for a load on the first electrical test port;
calculating load match (Elf) using the response data measured during steps (a), (b), and (c);
(d) measuring electrical response data for a short on a second electrical test port of the lightwave component analyzer;
(e) measuring electrical response data for an open on the second electrical test port;
(f) measuring electrical response data for a load on the second electrical test port;
calculating reverse source match (Esr), reverse reflection tracking (Err), and reverse directivity (Edr) using the response data measured during steps (d), (e), and (f);
(g) measuring electrical isolation response data, which is used as Exf;
(h) measuring electrical response data for an electrical through, connection which is used to calculate load match (Elf);
(i) measuring electrical and optical response data for respective electrical and optical through connections connected across the first and second electrical test ports and first and second optical test ports of the lightwave component analyzer, respectively, which are used to calculate transmission tracking (Etf);
and
using the response data for calculating error correction data to obtain a calibrated measurement on an O/E device.

10 more elements

A method for electrical-source-to-E/O-device impedance mismatch calibration and O/E-device-to-electrical-receiver impedance mismatch calibration in a lightwave component analyzer, comprising the steps of:

(a) measuring electrical response data for a short on a first electrical test port of the lightwave component analyzer;
(b) measuring electrical response data for an open on the first electrical test port;
(c) measuring electrical response data for a load on the first electrical test port;
calculating forward source match (Esf), forward reflection tracking (Erf), forward directivity (Edf), and load match (Elf) using the response data measured during steps (a), (b), and (c);
(d) measuring electrical response data for a short on a second electrical test port of the lightwave component analyzer;
(e) measuring electrical response data for an open on the second electrical test port;
(f) measuring electrical response data for a load on the second electrical test port;
calculating reverse source match (Esr), reverse reflection tracking (Err), and reverse directivity (Edr) using the response data measured during steps (d), (e), and (f);
(g) measuring electrical isolation response data, which is used as Exf;
(h) measuring electrical response data for an electrical through connection which is used to calculate load match (Elf);
(i) measuring electrical and optical response data for respective electrical and optical through connections connected across the first and second electrical test ports and first and second optical test ports of the lightwave component analyzer, respectively, which are used to calculate transmission tracking (Etf);
and
using the response data for calculating error correction data to obtain a calibrated measurement on at least one of an E/O device and an O/E device.

10 more elements

A method for electrical-source-to-E/O-device impedance mismatch calibration and O/E-device-to-electrical-receiver impedance mismatch calibration measurements in a lightwave component analyzer, comprising the steps of:

(a) measuring electrical response data for a short on a first electrical test port of the lightwave component analyzer;
(b) measuring electrical response data for an open on the first electrical test port;
(c) measuring electrical response data for a load on the first electrical test port;
(d) measuring electrical response data for a short on a second electrical test port of the lightwave component analyzer;
(e) measuring electrical response data for an open on the second electrical test port;
(f) measuring electrical response data for a load on the second electrical test port;
(g) measuring electrical isolation response data, which is used as Exf;
(h) measuring electrical response data for an electrical through connection which is used to calculate load match (Elf);
(i) measuring electrical and optical response data for respective electrical and optical through connections connected across the first and second electrical test ports and first and second optical test ports of the lightwave component analyzer, respectively, which are used to calculate transmission tracking (Etf);
and
using the response data for calculating error correction data to obtain a calibrated measurement on at least one of an E/O device and an O/E device.

8 more elements

Dependencies are inferred from the claim text.

Calibration and error correction for electrical-source-to-E/O-device impedance mismatch and O/E-device-to-electrical-receiver impedance mismatch in a lightwave component analyzer

Life of this patent

Calibration and error correction for electrical-source-to-E/O-device impedance mismatch and O/E-device-to-electrical-receiver impedance mismatch in a lightwave component analyzer

Life of this patent

Abstract

Claims20