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US 5,168,419 AGranted
Capacitor and pressure transducer
AssigneePanex Corporation
InventorLeroy C. Delatorre
Life of this patent
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AssigneePanex Corporation
InventorLeroy C. Delatorre
Estimating the term…
A dual capacitor device for utilizing dependent capacitances for measurement purposes where an upper capacitor base member and a lower capacitance base member are arranged with parallel capacitor surfaces in horizontal planes and where the parallel capacitor surfaces are located on opposite sides relative to a vertical axis to define first and second capacitors. The lower capacitor base member has a centrally located section connected to an outer section of the lower capacitor base member by a torsion beam and the centrally located section is attached to the upper capacitor base member by a vertical arm member. The torsion beam means has a displacement axis normal to the central axis so that angular displacement of the torsion beam and the centrally located section about the displacement axis produces a capacitance change in the first and second capacitors. A force moment applied to the centrally located section by a spirally wound bourdon tube in response to pressure develops a low force on the torsion beam which is less than the micro yield point of the torsion beam material and develops a micro dimensional angular displacement of the centrally located section and a capacitance change as a function of the force to measure high pressures with small deflections of the capacitor. The structure is arranged to compensate for changing temperature.
A dual capacitor device for utilizing dependent capacitances for measurement purposes comprising:
A method of measuring capacitance in a dual capacitor device utilizing dependent capacitances for measurement purposes and wherein the capacitor device has an upper capacitor base member and a lower capacitance base member arranged with parallel capacitor surfaces in horizontal planes where said parallel capacitor surfaces are located on opposite sides relative to a vertical central axis and said capacitance surfaces define first and second capacitors having first and second capacitance gaps comprising the steps of:
A method of measuring capacitance in a dual capacitor device utilizing dependent capacitances for measurement purposes and wherein the capacitor device has an upper capacitor base member and a lower capacitance base member arranged with parallel capacitor surfaces in horizontal planes where said parallel capacitor surfaces are located on opposite sides relative to a vertical central axis and said capacitance surfaces define first and second capacitors having first and second capacitance gaps and wherein the lower capacitance base member has torsion beam means disposed along a horizontal displacement axis with the torsion beam means coupled to a vertical moment arm on the upper capacitor base member comprising the steps of:
Dependencies are inferred from the claim text.