Back to results
US 5,168,324 AGranted
Wavelength meter having elliptical wedge
AssigneeThe United States of America as represented by the United States Department of Energy
InventorsRichard P. Hackel, Mark Feldman
Life of this patent
Estimating the term…
Abstract
A wavelength meter is disclosed which can determine the wavelength of a laser beam from a laser source within an accuracy range of two parts in 10.sup.8. The wavelength meter has wedge having an elliptically shaped face to the optical path of the laser source and includes interferometer plates which form a vacuum housing.
Claims7
A wavelength meter apparatus comprising
- wedge means,
- mirror means for reflecting a laser beam form a laser source to said wedge means, said wedge means having an elliptical shaped face to the path of said laser beam to produce interfering beams having an interference pattern in an elliptical shape, said wedge means further including interferometer plates which form an integral vacuum housing,
- diode array means oriented along the major axis of said elliptical shape to detect the fringe patterns of said interference pattern to produce electrical signals corresponding thereto, and
- means for processing said electrical signals to determine the wavelength of said light beam.
1 more element
A wavelength meter apparatus comprising
- wedge means,
- mirror means for reflecting a light beam from a light source to said wedge means, said wedge means having elliptical shaped face to the path of said light beam to produce interfering beams having an interference pattern in an elliptical shape, said wedge means further including interferometer plates which form an integral vacuum housing,
- diode array means oriented along the major axis of said wedge means to detect the fringe patterns of said interference pattern to produce electrical signals corresponding thereto, and
- means for processing said electrical signals to determine the wavelength of said light beam within two parts in 10.sup.8.
1 more element
In an atomic vapor laser isotope separation process, wavelength meter apparatus for use in said AVLIS process, said apparatus comprising
- wedge means,
- mirror means for reflecting said laser beam from a laser source to said wedge means, said wedge means having an elliptical shaped face to the path of said laser beam to produce interfering beams having an interference pattern in an elliptical shape, said wedge means further including interferometer plates which form an integral vacuum housing,
- diode array means oriented along the major axis of said wedge means to detect the fringe patterns of said interference pattern to produce electrical signals corresponding thereto, and
- means for processing said electrical signals to determine the wavelength of said light beam.
1 more element
Dependencies are inferred from the claim text.