Method of fabricating IIL and vertical complementary bipolar transistors
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsAkihiro Kanda, Mitsuo Tanaka, Takehiro Hirai, Masahiro Nakatani
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AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsAkihiro Kanda, Mitsuo Tanaka, Takehiro Hirai, Masahiro Nakatani
Estimating the term…
The present invention provides a semiconductor device, in particular, a semiconductor device comprising a vertical npn transistor, a vertical pnp transistor and an IIL which are integrated on the same one-conductivity type semiconductor substrate (1). The IIL comprises an emitter, a base and a collector which are respectively comprised of a high-density n.sup.+ -type first buried layer (5), a p.sup.+ -type second buried layer (8) having a lower impurity density than the n.sup.+ -type first buried layer (5), and at least one of n.sup.+ -type diffused layer (31). The semiconductor device thus constituted makes it possible to increase the emitter injection efficiency while the base impurity density is kept high, and also to decrease the base width, so that the collector-emitter breakdown voltage and current gain of the IIL can be more improved and also the operation speed of the IIL can be made higher.
A method of fabricating a semiconductor device having a vertical npn transistor, a vertical pnp transistor and an IIL, comprising the steps of;
A method of fabricating a semiconductor device having a vertical npn transistor, a vertical pnp transistor and an IIL, comprising the steps of;
A method of fabricating a semiconductor device having a vertical npn transistor, a vertical pnp transistor and an IIL, comprising the steps of;
Dependencies are inferred from the claim text.