# US 5,153,444 A · Method and apparatus for detecting patterns > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 5,153,444 A - Document ID: US5153444A - Status: Granted - Kind: A - Application number: 07/641,001 - Filed: 1991-01-14 - Granted: 1992-10-06 - Earliest claimed: 1989-09-18 - Assignees: Hitachi, Ltd. - Inventors: Shunji Maeda; Takashi Hiroi; Hitoshi Kubota; Hiroshi Makihira; Fumiaki Endo - Web page: https://patentgrep.com/patent/US5153444A ## CPC - G06T 7/001: {using an image reference approach} - G01N 21/95607: {using a comparative method} - G01N 2021/8896: {Circuits specially adapted for system specific signal conditioning} - G01N 2021/95615: {with stored comparision signal} - G06T 2207/30148: Semiconductor; IC; Wafer - G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) ## Abstract A method and apparatus for detecting a defect in a circuit pattern by detecting a gray image signal from each of a plurality of circuit patterns as objects of inspection, which circuit patterns have been fabricated so as to be identical with one another, and detecting a defect as a difference of edge position between two circuit patterns by comparing the detected gray image signal of one circuit pattern with the detected gray image signal of another circuit pattern. ## Claims ### Claim 1 A method for detecting a defect in a circuit pattern comprising the steps: detecting a gray image signal from each of a plurality of circuit patterns as objects of inspection, which circuit patterns have been fabricated so as to be identical with one another; and detecting a defect as a difference of edge position between two circuit patterns by comparing the detected gray image signal of one circuit pattern with the detected gray image signal of another circuit pattern. ### Claim 2 (depends on 1) A method according to claim 1, wherein the step of detecting a defect includes obtaining a difference of the comparing of the detected gray image signals and detecting a defect in accordance with the difference. ### Claim 3 (depends on 2) A method according to claim 2, wherein the step of detecting a defect includes obtaining a difference of gray image signals having a larger value at a normal portion than a value at a defect portion. ### Claim 4 (depends on 1) A method according to claim 1, wherein the step of detecting a defect includes comparing polarities of the gray image signals to detect a defect. ### Claim 5 (depends on 4) A method according to claim 4, wherein the step of detecting a defect includes subjecting the gray image signals to differentiation processing to provide differentiated signals and, comparing polarities of the differentiated signals with each other. ### Claim 6 (depends on 5) A method according to claim 5, wherein the differentiation processing is linear differentiation processing providing linear derivatives. ### Claim 7 (depends on 6) A method according to claim 6, wherein comparison of polarities of the linear derivatives as the differentiated signals is performed only for image signals having linear derivatives with absolute values larger than a preset value. ### Claim 8 (depends on 5) A method according to claim 5, wherein the differentiation processing includes linear differentiation processing providing linear derivatives and second differentiation processing providing second derivatives, and the comparing of polarities of the linear derivatives is performed in regions obtained in accordance with the second derivatives. ### Claim 9 (depends on 5) A method according to claim 5, wherein the step of detecting a defect includes comparing, in an edge region, polarities of the differentiated signals with each other and obtaining, in a non-edge region, difference image signals between the compared gray image signals, and binarizing the difference image signals with a predetermined threshold value. ### Claim 10 (depends on 5) A method according to claim 5, wherein the step of detecting a defect includes aligning the gray image signals with each other at a position where the number of pixels disagreeing in polarity is at a minimum, and comparing the aligned gray image signals with each other. ### Claim 11 (depends on 5) A method according to claim 5, wherein the step of detecting a defect includes aligning the gray image signals with each other at a plurality of positions where the number of pixels disagreeing in polarity is less than a preset value, detecting difference image signals between the gray image signals aligned with each other at the plurality of positions, and binarizing the difference image signals with a predetermined threshold value. ### Claim 12 (depends on 5) A method according to claim 5, wherein the step of detecting a defect includes aligning the gray image signals with each other at a plurality of positions where the number of pixels disagreeing in polarity is less than a preset value, and comparing the polarity signals aligned at the plurality of positions. ### Claim 13 (depends on 5) A method according to claim 5, wherein the step of detecting a defect includes aligning the gray image signals with each other at a plurality of positions where the number of pixels disagreeing in polarity is less than a preset value, and comparing the polarity signals aligned at the plurality of positions so as to detect a polarity disagreement common at a plurality of positions as the defect. ### Claim 14 An apparatus for detecting a defect in a circuit pattern comprising: means for detecting a gray image signal from each of a plurality of circuit patterns as objects of inspection, which circuit patterns have been fabricated so as to be identical with one another; and means for detecting a defect as a difference of edge position between two circuit patterns by comparing the detected gray image signal of one circuit pattern with the detected gray image signal of another circuit pattern. ### Claim 15 (depends on 14) An apparatus according to claim 14, wherein the means for detecting a defect includes comparison means for comparing the gray image signals and obtaining a difference of the comparison, and means for detecting a defect in accordance with the difference. ### Claim 16 (depends on 15) An apparatus according to claim 15, wherein means for detecting a defect includes means for obtaining a difference of gray image signals having a larger value at a normal portion than a value at a defect portion. ### Claim 17 (depends on 14) An apparatus according to claim 14, wherein the means for detecting a defect includes comparison means for comparing polarities of the gray image signals to detect a defect. ### Claim 18 (depends on 17) An apparatus according to claim 17, wherein the means for detecting a defect includes differentiating means for subjecting the gray image signals to differentiation processing to provide differentiated signals and means for comparing polarities of the differentiated signals with each other. ### Claim 19 (depends on 18) An apparatus according to claim 18, wherein the differentiation means is a linear differentiation means providing linear derivatives. ### Claim 20 (depends on 19) An apparatus according to claim 19, wherein the comparison means effects comparison of the linear derivatives as the differentiated signals only for image signals having linear derivatives with absolute values larger than a preset value. ### Claim 21 (depends on 18) An apparatus according to claim 18, wherein the differentiation means includes linear differentiation means and second differentiation means and the comparison means effects comparing of polarities of the linear derivatives in regions obtained in accordance with the second derivatives. ### Claim 22 (depends on 18) An apparatus according to claim 18, wherein the means for detecting a defect includes the comparison means comparing, in an edge region, the polarities of the differentiated signals with each other and obtaining, in a non-edge region, difference image signals between gray image signals, and means for binarizing the difference image signals with a predetermined threshold value. ### Claim 23 (depends on 18) An apparatus according to claim 18, wherein the means for detecting a defect includes aligning means for aligning the gray image signals with each other at a position where the number of pixels disagreeing in polarity is at a minimum, and the comparison means comparing the aligned image signals with each other. ### Claim 24 (depends on 18) An apparatus according to claim 18, wherein the means for detecting a defect includes aligning means for aligning the gray image signals with each other at a plurality of positions where the number of pixels disagreeing in polarity is less than a preset value, means for detecting difference image signals between the gray image signals aligned with each other at the plurality of positions, and means for binarizing the difference image signals with a predetermined threshold value. ### Claim 25 (depends on 18) An apparatus according to claim 18, wherein the means for detecting a defect includes aligning means for aligning the gray image signals with each other at a plurality of positions where the number of pixels disagreeing in polarity is less than a preset value, and the comparison means comparing the polarity signals aligned at the plurality of positions. ### Claim 26 (depends on 18) An apparatus according to claim 18, wherein the means for detecting a defect includes aligning means for aligning the gray image signals with each other at a plurality of positions where the number of pixels disagreeing in polarity is less than a preset value, and the comparison means comparing the polarity signals aligned at the plurality of positions so as to detect a plurality disagreement common at a plurality of positions as the defect.