Replaceable tip test probe
AssigneeITT Corporation
InventorJerry L. Lee
Life of this patent
Estimating the term…
Abstract
An electrical test probe with replaceable tip is provided, which is of low cost and high durability. The probe includes a body (16, FIG. 5) having a chuck-holding recess (26) in its front, with the walls of the recess forming a shoulder at the front and forming an external thread. A probe-holding chuck (52) has a rear portion lying in the body recess; a nut (14) surrounds the front of the chuck and is threadably connected to the body. The chuck is split along an imaginary plane (70) extending at an angle of about 45.degree. from the axis of the probe, into front and rear chuck parts (64, 66). As the nut is tightened to press against the front end of the chuck, the front chuck part (64) slides sidewardly along the split plane so the probe tip (12) is trapped by shear forces between the forward and rearward chuck parts (64, 66).
Claims8
An electrical test probe with replaceable tip comprising:
- an elongated test probe body having a wire-passing hole and having a front end portion with walls forming a chuck holding recess communicating with said hole, said body forming an at least partially forward-facing shoulder, and said walls having threads;
- a chuck with at least a rear end lying in said recess and with an abutment that can abut said shoulder, said chuck having an axis and having a forwardly-opening tip holding chuck hole;
- a nut with a tip passing hole, said nut threadably engaged with said body threads and having a shoulder that presses rearwardly against said chuck;
- said chuck has separate front and rear parts that each includes part of said tip holding chuck hole, said parts having adjacent surfaces with at least one of them extending substantially parallel to an imaginary plane that extends at an angle of a plurality of degrees from said axis but a plurality of degrees less than 90.degree. from said axis, said front part sliding along said plane as said nut is tightened so a probe tip in said chuck hole is trapped between said chuck parts.
An electrical test probe with replaceable tip comprising:
- an elongated test probe body having rearward and forward portions and having a hole extending along its length, said hole having a forward end with recess walls forming a chuck-holding recess, said recess walls having an external thread;
- a chuck having an axis and a probe-holding hole substantially on said axis, said chuck having forward and rearward parts with said rearward part lying in said recess and having a largely rearwardly-facing abutment that abuts said body and with said forward part having a front end, said forward and rearward parts being separate parts with adjacent surfaces substantially parallel to an imaginary plane that is normal to a line extending at an angle of between 10.degree. and 80.degree. from said axis;
- a nut which has a hole that is substantially aligned with said chuck hole, an internally threaded rear portion that is engaged with said body threads, and a largely rearwardly-facing shoulder that abuts said chuck front end.
Dependencies are inferred from the claim text.