Apparatus and method for automated inspection of a surface contour on a workpiece

An inspection apparatus for measuring a surface contour on a workpiece, comprising:

• (a) means for supporting a workpiece along a horizontal axis so as to orient a surface contour thereon in a position for measurement, said supporting means being operable for rotating the workpiece about the horizontal axis;
• (b) an elongated contact member having a pair of arms extending in opposite directions, each of said arms having an end element thereon;
• (c) at least one measurement device including a displaceable contact probe and electrical means for measuring the displacement of said contact probe;
• and
• (d) means disposed between said pair of oppositely-extending arms of said contact member and mounting said contact member in a generally vertical orientation and for movement of said oppositely-extending arms of said contact member and said end elements there with in planes containing first and second orthogonally-disposed axes and to place said end elements respectively in contact with the surface contour on the workpiece to be measured and said displaceable contact probe of said measurement device such that, as the workpiece is rotatably moved about its horizontal axis, said end element of said one contact member arm contacting the workpiece follows the surface contour thereof and causes said end element of said other contact member arm contacting said probe of said measurement device to correspondingly move and cause displacement of said probe such that said measurement device measures the radius of the surface contour.