X-ray automatic synchronous inspection system

A method of inspecting the contents of each of a plurality of containers moving through an inspection station, comprising the steps of:

• (A) sensing the presence of a container moving through said inspection station;
• (B) generating, in response to sensing a container in step (A), a waveform having a predefined amplitude contour;
• (C) controlling a direct current delivered to an X-ray source in proportion to the amplitude contour of the waveform generated in step (B), said direct current causing said X-ray source to irradiate the container sensed in step (A) with X-rays, thereby creating an X-ray pattern representing the contents of said container;
• (D) capturing said X-ray pattern;
• and
• (E) analyzing said X-ray pattern.

X-ray apparatus for inspecting the contents of a plurality of moving containers moving through an inspection station, comprising:

• means for detecting the of one of said containers at said inspection station;
• a trigger circuit responsive to said detecting means for generating a trigger pulse;
• a pulse generating circuit responsive to said trigger pulse for generating a control pulse having a predefined amplitude contour;
• an X-ray generating means responsive to said amplitude contour of said control pulse for irradiating one of said containers with X-rays to produce an X-ray image of said container, wherein the intensity of said X-rays is directly related to the amplitude contour of said control pulse;
• means for capturing the X-ray image;
• processor means coupled with said capturing means for analyzing the X-ray image to determine the contents of said container;
• and
• an adjustable iris disposed in the optical path of said camera and responsive to a command signal from said processor for attenuating the intensity of the X-ray image received by said capturing means.