Spectroanalytical systems

A spectroanalytical system comprising:

• entrance aperture defining structure for receiving radiation to be analyzed along a first path, said entrance aperture defining structure including a plurality of aligned slits disposed in said first path, one of said slits having a height at least about twice the height of another of said slits;
• collimating structure in said first path for collimating radiation in said first path and directing said collimated radiation along a second path;
• shutter structure for selectively opening said slits to pass radiation from a sample source along said first path to said collimating structure;
• first refraction structure in said second path of said radiation for spatially separating said collimated radiation in said second path as a function of wavelength in a first direction;
• echelle grating structure in said second path for spatially separating said refracted radiation from said first refraction structure in a second direction orthogonal to said first direction and directing said orthogonally refracted radiation in a beam along a third path that does not pass through said first refraction structure;
• and
• detector structure for detecting said beam of orthogonally refracted radiation.

A spectroanalytical system comprising:

• entrance aperture defining structure for receiving radiation to be analyzed along a first path;
• said entrance aperture defining structure including first and second aligned slits of equal width disposed in said first path, one of said slits having a height at least about twice the height of the other of said slits;
• collimating structure in said first path for collimating radiation in said first path and directing said collimated radiation along a second path;
• structure for varying the effective height of the entrance aperture including shutter structure for opening one slit or the other to pass radiation to said collimating structure, the taller of said slits being employed with shorter wavelength radiation, and the shorter of said slits being employed with longer wavelength radiation;
• first refraction structure in said second path for spatially separating said collimated radiation in said second path in a first direction as a function of wavelength;
• echelle grating structure in said second path for spatially separating said refracted radiation from said first refraction structure in a second direction orthogonal to said first direction as a function of wavelength;
• and
• detector structure for detecting said beam of orthogonally refracted radiation.

A spectroanalytical system comprising:

• entrance aperture defining structure for receiving radiation to be analyzed along a first path;
• said entrance aperture defining structure including a plurality of aligned slits disposed in said first path, said slits having graduated heights,
• collimating structure including a spherical mirror in said first path for collimating radiation in said first path and directing said collimated radiation along a second path;
• shutter structure for selectively opening said slits to pass radiation from a sample source to said collimating structure, a taller one of said slits being employed with shorter wavelength radiation, and a shorter one of said slits being employed with longer wavelength radiation,
• prism structure disposed in said second path for spatially separating said collimated radiation in said second path as a function of wavelength in a first direction;
• reflective echelle grating structure in said second path for spatially separating said refracted radiation from said prism structure in a second direction orthogonal to said first direction and directing said orthogonally refracted radiation in a beam along a third path that does not pass through said prism structure;
• said prism structure being disposed in said second path about halfway between said collimating structure and said echelle grating structure and providing dispersion over a five hundred nanometer wavelength range of at least about ten millimeters at said echelle grating structure;
• a solid state, addressable two-dimensional multichannel charge injection device detector array that has at least fifty thousand pixels per square centimeter of detection area for detecting said beam of orthogonally refracted radiation;
• first baffle structure extending between said first and second paths;
• second baffle extending between said second and third paths;
• toric reflector structure in said third path for receiving said beam of orthogonally refracted radiation form said echelle grating structure and directing said orthogonally refracted radiation along a fourth path to said detector array;
• third baffle structure between said third and fourth paths;
• and
• light tight housing structure in which said collimating structure, said prism structure, and said echelle grating structure are disposed, said housing structure having a width of less than forty centimeters, a length of less than eighty centimeters, and a height of less than thirty centimeters;
• said system having a wavelength range of at least four hundred nanometers over at least twenty orders for analysis of a sample without movement of said collimating structure, said prism structure, and said echelle grating structure.