Driver system and distributed transmission line network for driving devices under test
AssigneeReliability Incorporated
InventorsHarry K. Haill, James R. Birchak, Wai-Leung Hon
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AssigneeReliability Incorporated
InventorsHarry K. Haill, James R. Birchak, Wai-Leung Hon
Estimating the term…
A distributed transmission line network for connecting a plurality of DUTs to a low-power driver includes a plurality of distributed transmission lines with distributed capacitors. The distributed capacitors are added to the distributed transmission lines to make the propagation delay on each line equal, thereby eliminating skewed input signals to the DUTs. The capacitors also minimize capacitive cross-talk between the plurality of distributed transmission lines. The distributed transmission line network includes a driver with an internal resistance that is much less than the characteristic impedance of the distributed transmission line to minimize the voltage drop at the driver. The distributed transmission line also includes an input RC network for speeding rise time and a termination RC network for minimizing reflections in the distributed transmission line.
Burn-in apparatus, comprising:
A system for providing test signals to a plurality of DUTs, comprising:
A distributed transmission line network for providing test signals to devices under test, comprising:
A system for providing test signals to devices under test, comprising:
A distributed transmission line network for maintaining the uniformity of a test signal along the length of a transmission line connected in series to devices under test, comprising:
A method for equalizing the propagation delay along a plurality of transmission lines, wherein the transmission lines provide test signals from a plurality of drivers to devices under test, comprising the steps of:
Dependencies are inferred from the claim text.