Device for the dielectric characterization of samples made of a material having a flat or uneven surface and application for the non-destructive control of the dielectric homogeneity of said samples

A method for measuring the dielectric characteristics of a material sample by means of a measuring probe in contact with the surface, comprising the steps of:

• (a) placing the material sample onto a plate which is coupled to means for displacing said plate along two orthogonal axes within the plane containing said plate;
• (b) coupling said material sample to an orthogonal displacement means for displacing said material sample along an axis orthogonal to the plane containing said plate;
• (c) connecting a vacuum pump to a suction device positioned around the lower portions of the measuring probe in contact with a first measuring point on the surface of said material sample, such that a substantially air-tight seal is formed between the surface of said material sample and the lower portions of the probe;
• (d) creating suction between the surface of said material sample and the probe such that good contact is maintained between the surface of said material sample and said probe at said first measuring point;
• (e) conducting a measurement at said first measuring point;
• (f) moving said probe to a new measuring point;
• (g) creating suction between the surface of said material sample and the probe such that good contact is maintained between the surface of said material sample and said probe at said new measuring point;
• (h) conducting a measurement at said new measuring point;
• and
• (i) repeating steps (f) to (h) in sequence.

A method for measuring the dielectric characteristics of a material sample by means of a measuring probe in contact with the surface of the sample, wherein the sample has a curved shape, comprising:

• (a) removably fixing the sample onto a chuck, said chuck having rotation means allowing said chuck to rotate about an axis different from the axis of the probe, said chuck also having displacement means allowing said chuck to be displaced along an axis parallel to the axis of the probe;
• (b) connecting a vacuum pump to a suction device positioned around the lower portions of the measuring probe in contact with a first measuring point on the surface of said material sample, such that a substantially air-tight seal is formed between the surface of said material sample and the lower portions of the probe;
• (c) creating suction between the surface of said material sample and the probe such that good conduct is maintained between the surface of said material sample and said probe at said first measuring point;
• (d) conducting a measurement at said first measuring point;
• (e) moving said probe to a new measuring point;
• (f) creating suction between the surface of said material sample and the probe such that good contact is maintained between the surface of said material sample and said probe at said new measuring point;
• (g) conducting a measurement at said new measuring point;
• and
• (h) repeating steps (f) to (h) in sequence.