Light waveform measuring apparatus
AssigneeHamamatsu Photonics K.K.
InventorsAkira Takahashi, Musubu Koishi, Yutaka Tsuchiya
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Abstract
A wavelength of light emitted from a semiconductor laser is shifted to a shorter wavelength with wavelength converting means and the resulting light of a shorter wavelength is applied to a sample. Upon exposure to the light of the shorter wavelength, the sample emits light of interest and its waveform is measured with measuring means. Fundamental wavelength laser light which passes through the waveform converting means is outputted therefrom in synchronism with the light of a shorter wavelength and detected by a first photodetector. The waveform of the light of interest can be measured correctly on the basis of an output signal from the first photodetector.
Claims4
A light waveform measuring apparatus for measuring a waveform of light emitted from a sample upon exposure to laser light, comprising:
- a semiconductor laser for emitting first laser light having a fundamental wavelength;
- wavelength converting means for emitting, in response to substantially all of said first laser light, second laser light having a wavelength shorter than said fundamental wavelength, and a third laser light having said fundamental wavelength, said second laser light irradiating said sample;
- a first photodetector for detecting said third laser light transmitted from said wavelength converting means, and for producing a first output signal;
- and
- measuring means for detecting said light emitted from said sample to measure said waveform thereof on the basis of said first output signal from said first photodetector.
Dependencies are inferred from the claim text.