Spectroscopy characterization module

A spectroscopy characterization module having a particular configuration comprising:

• a light tight housing for performing spectroscopy measurements having a first optical port for passing monochromatic radiation therethrough and a second optical port for passing optically chopped coherent radiation therethrough;
• means for holding a material sample disposed within said light tight housing;
• first image focusing means for focusing monochromatic radiation passing through the first optical port onto the material sample producing a substanially one-to-one image of the monochromatic radiation passing through the first optical port on the material sample;
• a rotatabe detector mount disposed within said housing for holding a detector in a first position that detects radiation transmitted through the material sample and for holding the detector in a second position that detects radiation reflected off the materials sample;
• second image focusing means for focusing radiation transmitted through the material sample onto the detector producing a substantially one-to-one image of the radiation transmitted through the material sample onto the detection the first position;
• third image focusing means for focusing monochromatic radiation reflected off the material sample onto the detector producing a substantially one-to-one image of the radiation reflected off the material sample onto the detector in the second position;
• and
• forth image focusing means for focusing the optically chopped coherent radiation passing through the second optical port onto the material sample so that the opticl properties of the material sample are modulated by the optically chopped coherent radiation;
• whereby various spectroscopic mesurements can be performed on the material sample without changing the configuration of the characterization module.

A spectroscopy characterization module having a particular configuration comprising:

• a light tight housing for performing spectroscopy measurements having a first optical port for passing monochromatic radiation therethrough and a second optical port for passing optically chopped coherent radiation therethrough;
• a material sample mount disposed within said housing for holding a material sample;
• a first filter holder disposed wihtin said housing for holding a first filter;
• a second filter holder disposed within said housing for holding a second filter;
• a first one-to-one image forming mirror for focusing monochromatic radiation passing through the first optical port onto the material sample;
• a rotatable detector mount disposed within said housing for holding a detector in a first position for detecting radiation transmitted through the sample and for holding the detector in a second position for detecting radiation reflected off the sample;
• a second one-to-one image forming mirror for focusing radiation transmitted through the material sample onto the detector in the first position through the first filter;
• a third one-to-one image forming mirror for focusing radiation reflected off the material shape onto the detector in the second position through the second filter;
• and
• a lens disposed within said housing for focusing the optically chopped coherent radiation passing through the second optical port onto the material sample so that the optical properties of the material sample are modulated by the optically chopped coherent radiation;
• whereby various spectroscopic measurements can be performed on the material sample without changing the configuration of the characterization module.