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AssigneeU.S. Philips Corporation
InventorsSebastiaan C. Verhelst, Evert Seevinck, Keith Baker
Estimating the term…
An arrangement for measuring the quiescent current of a digital IC includes a current sensor connected in series with the IC and the voltage supply, a voltage stabilization circuit for stabilizing the voltage across the IC and a signal processing circuit coupled thereto for processing the measured quiescent current. The quiescent current is measured when no flip-flops are switched in the IC. By means of the arrangement, it is possible to measure rapidly and accurately whether the quiescent current assumes an abnormal value, which indicates that the IC contains defects. The signal processing circuit may include a current mirror which is coupled to a current comparator circuit supplying a digital output signal for determining the existence of a defect.
An arrangement for measuring a quiescent current of an integrated monolithic digital circuit comprising a transistor current sensor for receiving the IC quiescent current and which includes a first connection terminal for coupling to a supply terminal of the integrated monolithic circuit and with a voltage second connection terminal for coupling to a supply, characterized in that the arrangement comprises voltage stabilization means for stabilizing a voltage at the first connection terminal and signal processing means coupled to the voltage stabilization means for signal processing of the quiescent current.
Apparatus for testing an integrated monolithic digital circuit comprising:
Dependencies are inferred from the claim text.