Radio frequency plasma enhanced chemical vapor deposition process and reactor
AssigneeAir Products and Chemicals, Inc.
InventorsGeorge Vakerlis, Ward D. Halverson, Diwakar Garg, Paul N. Dyer
Life of this patent
Estimating the term…
Loading patent…
AssigneeAir Products and Chemicals, Inc.
InventorsGeorge Vakerlis, Ward D. Halverson, Diwakar Garg, Paul N. Dyer
Estimating the term…
An improved capacitively coupled radio frequency-plasma enhanced chemical vapor deposition (PECVD) apparatus and process are disclosed for depositing a uniform coating of material on substrates. The apparatus includes a secondary electrode defining a reaction zone within an outer chamber and an RF electrode in concert with the secondary electrode for generating a plasma within the reaction zone. The electrode comprising a base and a finger extending through the reaction zone for distributing a plasma field uniformly throughout the reaction zone. The process comprises heating a substrate to a deposition temperature in the range of about 300.degree. to 650.degree. C. Reactant gases are introduced into the PECVD reactor and a coating of about 0.2 to about 20 .mu.m is deposited onto the heated substrate. This low temperature process is particularly adapted to coating three-dimensional objects of metals, metal alloys and mixtures of metals.
A capacitively coupled RF plasma enhanced chemical vapor deposition apparatus for depositing a uniform coating of material on substrates, said apparatus comprising:
The apparatus of claim 6 wherein non-conducting spacers are positioned between said apertured plate and said base of said RF electrode.
A capacitively coupled RF plasma enhanced chemical vapor deposition apparatus for depositing a uniform coating of material on substrates comprising a electrically conducting material, said apparatus comprising:
Dependencies are inferred from the claim text.