Infrared spectropolarimeter

An infrared spectropolarimeter system for making spectroscopic measurements of electro-optic properties of materials over a large wavelength range in the infrared, comprising:

• (a) a Fourier transform infrared spectrometer having a sample region for receiving a sample for making spectroscopic measurement thereon and a source of light for providing a sample beam of selected wavelength range in the infrared for projection through said sample region, said sample region defined between first and second focusing elements, said first focusing element disposed for selectively focusing said sample beam within said sample region, said second focusing element disposed for collimating said sample beam and providing an output beam for analysis;
• (b) first and second polarizers disposed between said first and second focusing elements with said sample region therebetween, for selectively polarizing said sample beam;
• (c) first and second rotatable optical retarders disposed between said first and second polarizers with said sample region therebetween, for selectively retarding one linear polarization component of said sample beam with respect to the orthogonal component of said sample beam;
• (d) means for controllably rotating said first and second optical retarders;
• and
• (e) detection means for analyzing said output beam.