US 5,036,271 AGranted

Apparatus for characterization of electrical properties of a semiconductor body

AssigneeSolid State Measurements, Inc.

InventorsRobert G. Mazur, Robert C. Stephenson, Donald A. Zier, Jr.

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Abstract

An apparatus for the measurement of electrical properties of a semiconductor wafer is disclosed. A top contact mercury probe for contacting the upper surface of a wafer body is provided. The mercury probe is held by a kinematically stable probe arm which provides for very controlled movement of the mercury probe. A semiconductor wafer body horizontal and rotational movement system is provided for moving the wafer body to provide mapping capability. A top side return contact for doing measurements on wafer bodies with insulating substrates is disclosed. The top side return contact is also provided with a self-levelling and raising function, which ensures the bottom surface of the contact member to intimately contact the upper surface of the wafer body when desired, and also to raise the contact member off the wafer body when the bottom contact underneath the wafer is utilized.

Claims5

Dependent claims

An apparatus for measurement of electrical properties of semiconductor wafer body, said apparatus comprising:

means for supporting said semiconductor wafer body in predetermined position;
top contact mercury probe means for contacting the upper surface of said wafer body with a mercury column, said top contact mercury probe means including capillary tube means for containing said mercury column;
pneumatic control means for applying a vacuum or pressure to said mercury column within said capillary tube means;
kinematically stable probe arm position means comprising a probe arm having said top contact mercury probe means affixed thereto, said kinematically stable probe arm positioning means for controlling the position of said capillary tube means relative to the upper surface of aid wafer body;
semiconductor wafer body horizontal and rotational movement means for moving said wafer body rotationally or horizontally relative to said capillary tube means;
measurement means for causing an electrical current to flow through said semiconductor wafer body and for measuring resultant electrical properties of said wafer body;
first electrical contact means connected in circuit with said memory column and said measurement means;
second electrical contact means for providing a path for current flow between said measurement means and said wafer body;
said measurement means connected in circuit with said first electrical contact means, said second electrical contact means and said wafer body.

6 more elements

Dependencies are inferred from the claim text.