# US 5,026,992 A · Spectral ratioing technique for NDIR gas analysis using a differential temperature source

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- Number: US 5,026,992 A
- Document ID: US5026992A
- Status: Granted
- Kind: A
- Application number: 07/403,587
- Filed: 1989-09-06
- Granted: 1991-06-25
- Earliest claimed: 1989-09-06
- Assignees: Gaztech Corporation
- Inventors: Jacob Y. Wong
- Web page: https://patentgrep.com/patent/US5026992A

## CPC

- G08B 29/20: Calibration, including self-calibrating arrangements
- G01N 21/255: {Details, e.g. use of specially adapted sources, lighting or optical systems}
- G01N 21/3504: for analysing gases, e.g. multi-gas analysis
- G08B 17/117: by using a detection device for specific gases, e.g. combustion products, produced by the fire (G08B17/103, G08B17/11 take precedence)
- G01J 2001/161: {Ratio method, i.e. Im/Ir}
- G01J 2001/182: {with SH sample and hold circuits}
- G01N 21/314: {with comparison of measurements at specific and non-specific wavelengths (dual wavelength spectrometry G01J3/427)}
- G01N 21/61: Non-dispersive gas analysers {(G01N21/3504 takes precedence)}
- G01N 2201/0228: Moulded parts
- G01N 2201/06186: Resistance heated; wire sources; lamelle sources
- G01N 2201/0696: Pulsed
- G08B: SIGNALLING SYSTEMS, e.g. PERSONAL CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N)

## Abstract

An instrument for determining the concentration of a particular gas that might be present in a sample has no moving parts and is extremely compact. The instrument uses as a source of radiation a device that has a radiating element whose temperature is alternated between T.sub.1 and T.sub.2 and whose spectrum approximates that of a blackbody. Radiation from this source is passed through a dual pass band filter that has two non-overlapping pass bands, one of which is centered at a wavelength at which the gas absorbs and the other of which is centered at a wavelength at which the sample does not absorb radiation. After passing through this filter, the radiation passes through the sample chamber and then is intercepted by a detector which produces an electrical signal determined by the radiation intercepted. The electrical signal is processed to provide an indication of the concentration of the gas.

## Claims

### Claim 1

A gas analyzer for determining the concentration of a gas that is included in a sample, comprising in combination:
a sample chamber containing the sample;
differential temperature source means including a radiating element and including means for altering the temperature of said radiating element from T.sub.1 to T.sub.2 and from T.sub.2 to T.sub.1 for producing radiation having a first spectrum when the temperature is T.sub.1 and having a second spectrum when the temperature is T.sub.2 ;
dual pass band filter means located between the radiating element of said differential temperature source means and said sample chamber, and having two non-overlapping pass bands, one of which is centered at a wavelength at which the gas absorbs radiation and the other of which is centered at a wavelength at which the sample does not absorb radiation, for simultaneously passing radiation within the two nonoverlapping pass bands;
detector means for intercepting radiation that has passed through said dual pass band filter means and through said sample chamber and for converting the intercepted radiation to an electrical signal; and,
circuit means electrically connected to said detector means for processing the electrical signal to determine the concentration of the gas;
said sample chamber, said differential temperature source means, said dual pass band filter means, said detector means, and said circuit means all remaining stationary when the gas analyzer is in use.

### Claim 2 (depends on 1)

The gas analyzer of claim 1 wherein the gas is methane, wherein one of said two non-overlapping pass bands is centered at a wavelength L.sub.1 =2.20 microns and the other of which is centered at a wavelength L.sub.2 =3.40 microns.

### Claim 3

In a gas analyzer of the type having a sample chamber containing a sample including a gas whose concentration is to be determined and through which radiation passes to a greater or lesser extent depending on the concentration of the gas, having a detector that intercepts radiation that has passed through the sample of gas and that converts the intercepted radiation to an electrical signal, and having circuit means connected to the detector for processing the electrical signal, the improvement comprising in combination:
differential temperature source means including a radiating element and means for altering the temperature of said radiating element from T.sub.1 to T.sub.2 and from T.sub.2 to T.sub.1 for producing radiation having a first spectrum when the temperature is T.sub.1 and having a second spectrum when the temperature is T.sub.2 ; and,
dual pass band filter means having two nonoverlapping pass bands, one of which is centered at a wavelength at which the gas absorbs radiation and the other of which is centered at a wavelength at which the sample does not absorb radiation, for simultaneously passing radiation within the two non-overlapping pass bands, said dual pass band filter means located between the sample chamber and the radiating element of said differential temperature source means;
said differential temperature source means and said dual pass band filter means remaining stationary when the gas analyzer is in use.

### Claim 4

A gas analyzer for determining the concentration of a gas that is included in a sample, comprising in combination:
a sample chamber containing the sample;
differential temperature source means including a radiating element and including means for altering the temperature of said radiating element from T.sub.1 to T.sub.2 and from T.sub.2 to T.sub.1 while the gas analyzer is in use, for producing radiation having a first spectrum when the temperature is T.sub.1 and having a second spectrum when the temperature is T.sub.2 ;
dual pass band filter means located on the opposite side of said sample chamber from the radiating element of said differential temperature source means, and having two non-overlapping pass bands, one of which is centered at a wavelength at which the gas absorbs radiation and the other of which is centered at a wavelength at which the sample does not absorb radiation, for simultaneously passing radiation within the two non-overlapping pass bands;
detector means for intercepting radiation that has passed through said dual pass band filter means and through said sample chamber and for converting the intercepted radiation to an electrical signal; and,
circuit means electrically connected to said detector means for processing the electrical signal to determine the concentration of the gas;
said sample chamber, said differential temperature source means, said dual pass band filter means, said detector means, and said circuit means all remaining stationary when the gas analyzer is in use.

### Claim 5 (depends on 4)

The gas analyzer of claim 4 wherein the gas is methane, wherein one of said two non-overlapping pass bands is centered at a wavelength L.sub.1 =2.20 microns and the other of which is centered at a wavelength L.sub.2 =3.40 microns.

### Claim 6

In a gas analyzer of the type having a sample chamber containing a sample including a gas whose concentration is to be determined and through which radiation passes to a greater or lesser extent depending on the concentration of the gas, having a detector that intercepts radiation that has passed through the sample of gas and that converts the intercepted radiation to an electrical signal, and having circuit means connected to the detector for processing the electrical signal, the improvement comprising in combination:
differential temperature source means including a radiating element and means for altering the temperature of said radiating element from T.sub.1 to T.sub.2 and from T.sub.2 and T.sub.1 while the gas analyzer is in use, for producing radiation having a first spectrum when the temperature is T.sub.1 and having a second spectrum when the temperature is T.sub.2 ; and,
dual pass band filter means having two non-overlapping pass bands, one of which is centered at a wavelength at which the gas absorbs radiation and the other of which is centered at a wavelength at which the sample does not absorb radiation, for simultaneously passing radiation within the two non-overlapping pass bands, said dual pass band filter means located between the sample chamber and the detector;
said differential temperature source means and said dual pass band filter means remaining stationary when the gas analyzer is in use.