US 5,010,552 A · Device and method for the generation of test vectors and testing method for integrated circuits

Abstract

A device and a method are used to test integrated circuits, especially P.L.A.s. The possible faults of a circuit to be tested are determined including logic faults caused by the physical structure and relative position of the circuit elements in the integrated logic circuit. On the basis of the faults, a set of test vectors is determined, each fault modifying at least one of the test vectors applied to the circuit to be tested. It is possible to use test vectors which are modified by the greatest number of possible faults. By determining the test vectors on the basis of the faults which are to be detected, the tests can use a small number of vectors while, at the same time, there is certainty that it will be possible to detect all the faults in a given circuit. Advantageously, a hierarchically-organized set of cells is determined with certain cells consisting of small cells. The method and device can be used to test P.L.A.s by using a small number of test vectors, and are applicable to testing integrated circuits and P.L.A.s.

Claims7

Dependent claims

A method of testing each of a series of integrated logic circuits comprising (FIG. 54)

the steps of
analyzing (60) each type of integrated circuit and determining (61) possible logic faults therein including logic faults caused by the physical structure and relative position of the circuit elements in the integrated logic circuit and how each such logic fault would affect outputs expected to be triggered from said integrated logic circuit by a particular pattern of inputs;
generating (63) and applying to inputs of each circuit at least one test vector per possible logic fault so that said vector applied to said logic circuit will trigger at least one actual output pattern which will reveal the existence of any such logic fault;
comparing the actual pattern of outputs from said integrated logic circuit with said expected outputs, and
indicating, for each integrated logic circuit tested, whether said actual and expected output patterns match;
wherein the fault-determining step comprises
the step of determining (62) cells logically equivalent to actual parts of the integrated circuit.

4 more elements

Dependencies are inferred from the claim text.

Device and method for the generation of test vectors and testing method for integrated circuits

Life of this patent

Device and method for the generation of test vectors and testing method for integrated circuits

Life of this patent

Abstract

Claims7