Non-contact sensing apparatus and method for temperature profile and thickness determination and control of radiation translucent materials

An apparatus for temperature profile determination in radiation translucent materials of arbitrary thickness comprising:

• an optical path for radiation to pass through the material;
• means of irradiating the material with a variable intensity radiation source such that radiation passes through the material;
• means of detecting the level of said radiation transmitted through the material, said detecting means generating an electrical signal responsive to the intensity of said transmitted radiation;
• a means for providing the surface temperature(s) of the material;
• computing means for receiving electrical signals from the radiation detection means and operating thereon for the determination of the material apparent transmissivity, apparent emissivity, and average (bulk) temperature of said material;
• computing means used in conjunction with said surface temperature(s) and average temperature, operating thereon for the calculation of temperature profiles and thickness of said material.