Method of inspecting die for forming honeycomb structure
AssigneeNGK Insulators, Ltd.
InventorsMitsuaki Watanabe, Masayoshi Nakane
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AssigneeNGK Insulators, Ltd.
InventorsMitsuaki Watanabe, Masayoshi Nakane
Estimating the term…
A method of inspecting a die having slits of narrow widths and a number of rear apertures communicating with the slits for forming honeycomb structures is able to inspect roughness distributions on inner surfaces of the rear apertures of the die. The method includes steps of irradiating diffused light beams onto an end face of the die on a side of the slits, detecting intensities of light beams arrived at an end face of the die on a side of the rear apertures by irregularly reflecting at inner surfaces of the rear apertures by the use of photosensitive device such as sensitized paper arranged at the end face of the die on the side of the rear apertures, and finally determining roughness distributions of the inner surfaces of the number of rear apertures with the aid of bright and dark portions on the photosensitive device.
A method of inspecting a die having slits of narrow widths and a number of rear apertures communicating with the slits for forming honeycomb structures, said method comprising steps of irradiating diffused light beams onto an end face of the die on a side of the slits, detecting intensities of light beams arrived at an end face of the die on a side of the rear apertures by irregularly reflecting at inner surfaces of the rear apertures by means of photosensitive means arranged at the end face of the die on the side of the rear apertures, and determining roughness distributions of the inner surfaces of the number of rear apertures with the aid of bright and dark portions on the photosensitive means.
Dependencies are inferred from the claim text.