Electron multipliers with reduced ion feedback
AssigneeGalileo Electro-Optics Corp.
InventorsPaul L. White, Bruce N. Laprade
Life of this patent
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Abstract
Reduced ion feedback in an electron multiplier (EM) is achieved by applying a higher than normal bias voltage to the EM and degassing the EM with a relatively high concentration of self-generated particles as a result of the applied bias voltage.
Claims43
An electrical device comprising:
- an electron multiplier having been scrubbed by the impact of particles thereon resulting from operating the EM at an applied voltage sufficient to result in the onset of self-sustained ion regeneration for a time sufficient to result in an effective termination of the self-sustained ion regeneration such that thereafter ion feedback is negligible when the EM is operated up to said applied voltage.
A method for scrubbing an electron multiplier by the impact of particles thereon comprising the step of applying a voltage on the EM sufficient to result in the onset of self-sustained ion regeneration, and maintaining said applied voltage for a time sufficient to result in effective termination of said self-sustained ion regeneration such that thereafter ion feedback is negligible when the EM is operated up to said applied voltage.
Dependencies are inferred from the claim text.