Charged particle beam apparatus
AssigneeU.S. Philips Corporation
InventorsPieter Kruit, Karel D. Van Der Mast
Life of this patent
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Abstract
A Variable Axis Lens system comprises at least two lenses which are arranged to be radially offset with respect to an optical axis of the apparatus. Because the lenses do not contain iron, the occurrence of disturbing eddy currents can be prevented. The lenses for axis displacement are preferably constructed as single ring conductors, a number of which can be readily arranged in one plane in a partly overlapping fashion. Such a system can also be arranged behind the object. For the lenses for axis displacement use is preferably made of a ceramic superconducting material having a comparatively high temperature coefficient and a comparatively high specific heat in the superconducting phase, so that they can be simply cooled from the outside.
Claims19
A charged particle beam apparatus comprising:
- (a) source means for providing charged particles,
- (b) charged particle optical means for controlling displacement of said charged particles,
- (c) Variable Axis Lens (VAL) means for transversely displacing an optical axis of said charged particles,
- said VAL means including at least two iron-free lenses arranged radially offset with respect to one another, and
- (d) carrier means for carrying an object receiving a beam of said charged particles.
Dependencies are inferred from the claim text.