Connector assembly for chip testing
AssigneeInternational Business Machines Corporation
InventorsBrian S. Beaman, Keith E. Fogel, Jungihl Kim, Wolfgang Mayr, Jane M. Shaw, George F. Walker
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AssigneeInternational Business Machines Corporation
InventorsBrian S. Beaman, Keith E. Fogel, Jungihl Kim, Wolfgang Mayr, Jane M. Shaw, George F. Walker
Estimating the term…
An electrical connector is described for making contact with a plurality of convex and deformable contacts on an electronic device. The electrical connector comprises a substrate having a plurality of conductors which extend above its surface. A polymeric material is disposed on the surface of the substrate and has openings which expose the conductors, each opening sized to receive one of the convex, deformable contacts, and to enable electrical connection between the exposed conductors and the deformable contacts. A mechanism is provided for urging the deformable contacts on the electronic device against the exposed conductors. The mechanism exerts sufficient force between the device and the conductors to cause some deformation of the convex contact areas by the conductors.
An electrical connector for making contact with a pattern of convex deformable contact areas on an electronic device, each said convex deformable contact area required to exhibit at least a minimum height dimension above a contact surface of said electronic device, comprising:
An electrical connector for making contact with a plurality of solder ball contact areas on an electronic device, comprising:
Dependencies are inferred from the claim text.