Gold diffusion method for semiconductor devices of high switching speed
AssigneeSanken Electric Co., Ltd.
InventorsYutaka Yoshizawa, Akira Uemura
Life of this patent
Estimating the term…
Loading patent…
AssigneeSanken Electric Co., Ltd.
InventorsYutaka Yoshizawa, Akira Uemura
Estimating the term…
Gold is diffused into a silicon substrate by first depositing an ultrathin layer of gold on one of the main faces of the substrate and then by heating the substrate to a temperature range of about 300.degree.-850.degree. C., instead of to about 1000.degree. according to the prior art. Then, following the removal of the remaining gold layer from over the substrate, the latter is reheated to a higher temperature ranging from about 700.degree. C. to about 1000.degree. C. for activating the diffused gold. The gold diffusion at the reduced temperature serves to decrease the surface irregularities of the substrate as a result of gold-silicon alloy zones created at the interface between gold layer and silicon substrate during the thermal diffusion process.
In the fabrication of a semiconductor device capable of high-speed switching operation, a method of gold diffusion which comprises:
A method of fabricating a semiconductor device capable of high-speed switching operation, which method comprises:
A method of fabricating a semiconductor device capable of high-speed switching operation, which method comprises:
Dependencies are inferred from the claim text.