Method for bubble-free bonding of silicon wafers
AssigneeDuke University
InventorsUlrich M. Goesele, Volker Lehmann
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AssigneeDuke University
InventorsUlrich M. Goesele, Volker Lehmann
Estimating the term…
A method for bubble-free bonding of silicon wafers to silicon wafers or silicon wafers to quartz wafers either outside or inside a Clean Room. The method includes the steps of positioning wafers in closely spaced-apart and parallel relationship to each other in a rack or the like with mirror-polished surfaces of the wafers facing each other, cleansing the mirror-polished surfaces with a hydrophilization cleansing solution, flushing the cleansing solution from the mirror-polished surfaces of the wafers with deionized water, drying the wafers in a spin-dryer, and moving the wafers together so that contact occurs between opposing mirror-polished surfaces of the wafers and bonding occurs. The bonded wafers are then placed into a wafer shipping and storing container for improved wafer storage performance.
A method for bonding at least two wafers and storing the bonded wafers in a wafer container wherein said at least two wafers includes at least one first wafer comprising silicon and at least one second wafer comprising either silicon or glass wherein each of said wafers has at least one mirror-polished surface, including the steps of:
A method for bonding at least two wafers and storing the bonded wafers in a wafer container wherein said at least two wafers includes at least one first wafer comprising silicon and at least one second wafer comprising either silicon or glass wherein each of said wafers has at least one mirror-polished surface, including the steps of:
A method for bonding at least two wafers and storing the bonded wafers in a wafer container wherein said at least two wafers includes at least one first semiconductor wafer and at least one second wafer comprising either a semiconductor material or glass wherein each of said wafers has at least one mirror-polished surface, including the steps of:
Dependencies are inferred from the claim text.