Circuit arrangement for testing integrated circuit components

An arrangement for testing a plurality of circuit components forming an integrated circuit on a common base plate comprising:

• testing circuit means common to each of the circuit components located in a region of the base plate independent of the circuit components for comparing output values of the circuit components with desired values for at least one test parameter, the testing circuit means being separable from the circuit components when the base plate is divided;
• switching stages means on the base plate and controllable by the testing circuit means for connecting the testing circuit means to each of the circuit components;
• means for providing a common power supply to the testing circuit means and switching stages means;
• the testing circuit means comprising an output circuit means for the output of test data, a central unit means for functionally testing the plurality of circuit components in accordance with a desired time sequence and for distinguishing between faulty and faultless circuit components with regard to the test parameter.