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US 4,948,962 AGranted
Plasma ion source mass spectrometer
AssigneeHitachi, Ltd.
InventorsYasuhiro Mitsui, Satoshi Shimura, Tsutomu Komoda
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AssigneeHitachi, Ltd.
InventorsYasuhiro Mitsui, Satoshi Shimura, Tsutomu Komoda
Estimating the term…
Disclosed is a plasma ion source mass spectrometer comprising an ion source in which a sample to be detected is ionized in plasma and a mass spectrometer which mass-separates and detects the ionized sample supplied from the ion source, characterized in that there is provided a gas introduction means for introducing into a region before the mass spectrometer a gas containing particles which can bring about a charge transfer reaction with background ions contained in particles supplied from the ion source or a gas containing particles which can bring about an energy transfer reaction with excited molecule contained in the particles supplied from the ion source. By providing such gas introduction means, background ions or excited molecule can be efficiently quenched and enhancement of sensitivity of plasma ion source mass spectrometer can be attained.
A plasma ion source mass spectrometer comprising an ion source in which a sample to be detected is ionized with plasma and a mass spectrometer which mass-separates and detects the ionized sample supplied from the ion source wherein a gas introduction means is provided for introducing into a region before the mass spectrometer a gas containing particles which can bring about a charge transfer reaction with background ions contained in particles supplied from the ion source.
A plasma ion source mass spectrometer comprising an ion source in which a sample to be detected is ionized with plasma and a mass spectrometer which mass-separates and detects the ionized sample supplied from the ion source wherein a gas introduction means is provided for introducing into a region before the mass spectrometer a gas containing particles which can bring about an energy transfer reaction with excited molecule contained in particles supplied from the ion source.
A plasma ion source mass spectrometer comprising an ion source in which a sample is ionized with plasma and a mass spectrometer which mass-separates and detects particles supplied from the ion source in which is provided a means to allow the particles supplied from the ion source to collide with particles which can remove charge from background ions other than the ions to be detected among the particles supplied from the ion source.
A plasma ion source mass spectrometer comprising an ion source in which a sample is ionized with plasma and a mass spectrometer which mass-separates and detects particles supplied from the ion source in which is provided a means to allow the particles supplied from the ion source to collide with particles which can remove energy from excited particles other than the ions to be detected among the particles supplied from the ion source.
Dependencies are inferred from the claim text.