Method of growing III-V semiconductor layers with high effective hole concentration
AssigneeAmerican Telephone and Telegraph Company
InventorsRobert A. Hamm, Roger J. Malik, Morton B. Panish, John F. Walker
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AssigneeAmerican Telephone and Telegraph Company
InventorsRobert A. Hamm, Roger J. Malik, Morton B. Panish, John F. Walker
Estimating the term…
36 We have discovered the III-V semiconductor layers with previously unattainably high effective hole concentrations can be produced by molecular growth processes (e.g. MBE) if an amphoteric dopant such as Be is used and if, during the growth of the highly doped III-V layer, the substrate is maintained at a temperature T.sub.g that is substantially lower than customarily used. For instance, a InGaAs layer with effective hole concentration 1.0.times.10.sup.20 cm.sup.-3 was grown at T.sub.g =450.degree. C., and a GaAs layer with effective hole concentration of 1.0.times.10.sup.20 cm.sup.-3 was grown at T.sub.g of 475.degree. C. The heavily doped III-V layers can be of device grade and can usefully be part of electronic devices such as high speed bipolar transistors.
A method of producing a semiconductor device comprising a first single crystal semiconductor region and a single crystal layer of III-V semiconductor material epitaxial with the first semiconductor region and comprising a non-amphoteric dopant species which imparts p-type conductivity to at least a portion of the layer of III-V material;
Dependencies are inferred from the claim text.