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US 4,924,091 AGranted
Scanning ion conductance microscope
AssigneeThe Regents of the University of California
InventorsPaul K. Hansma, Barney Drake
Life of this patent
Estimating the term…
Abstract
A scanning ion conductance microscope, SICM, which can image the topography of soft non-conducting surfaces covered with electrolytes by maintaining a micropipette probe at a constant conductance distance from the surface. It can also sample and image the local ion currents above the surfaces by scanning the micropipette probe in a plane located at a constant distance above the surface. Multiple micropipettes mounted in a multi-barrel head and containing various ion specific electrodes allow simultaneous scanning for different ion currents.
Claims11
A scanning ion conductance microscope comprising:
- (a) a reservoir holding a sample to be scanned therein;
- (b) a micropipette having an open tip communicating with a hollow shaft;
- (c) an electrolyte solution disposed within said reservoir covering said sample and disposed within said tip and shaft of said micropipette;
- (d) a first microelectrode diposed in said shaft in electrical contact with said electrolyte therein, said first microelectrode being spaced from inner sidewalls of said shaft to allow said electrolyte solution to pass between said first microelectrode and said inner sidewalls of said shaft;
- (e) a second microelectrode disposed in said reservoir in electrical contact with said electrolyte therein;
- (f) scanning means for scanning said tip of said micropipette over a top surface of said sample in a scanning pattern;
- (g) voltage means for applying a voltage across said first and second microelectrodes;
- (h) current means for measuring the current flowing between said first and second microelectrodes through said open tip of said micropipette and for supplying an indication of said current at an output thereof;
- and,
- (i) control logic means having an output connected to said scanning means and an input connected to said output of said current means for causing said scanning means to set the height of said tip at a desired distance above said top surface and for outputting data of interest related to said top surface as it is scanned.
7 more elements
A scanning ion conductance microscope capable of providing both topographic and ion conductance information about a sample comprising:
- (a) a reservoir holding a sample to be scanned therein;
- (b) a micropipette having an open tip communicating with a hollow shaft;
- (c) an electrolyte solution disposed within said reservoir covering said sample and disposed within said tip and shaft of said micropipette;
- (d) a first microelectrode disposed in said shaft in electrical contact with said electrolyte therein, said first microelectrode being spaced from inner sidewalls of said shaft to allow said electrolyte solution to pass between said first microelectrode and said inner sidewalls of said shaft;
- (e) a second microelectrode disposed in said reservoir in electrical contact with said electrolyte therein;
- (f) scanning means for scanning said tip of said micropipette over a top surface of said sample in a scanning pattern;
- (g) voltage means for applying a voltage across said first and second microelectrodes;
- (h) current means for measuring the current flowing between said first and second microelectrodes through said open tip of said micropipette and for supplying an indication of said current at an output thereof;
- (i) control logic means having an output connected to said scanning means and an input connected to said output of said current means for causing said scanning means to set the height of said tip at a desired distance above said top surface and for outputting data of interest related to said top surface as it is scanned;
- (j) feedback means connected between said scanning means and said control logic means for providing said control logic means with an indication of a z-directional component of the position of said tip of said micropipette;
- and wherein,
- (k) said control logic means includes first logic for causing said scanning means to position said tip of said micropipette at a distance above said top surface which will maintain the ion conductance between said first and second electrodes through said open tip of said micropipette at a constant value which will cause said tip to follow said top surface in close non-contacting proximity thereto whereby said data of interest output by said control logic means reflects the topology of said top surface;
- and,
- (l) said control logic means includes second logic for causing said scanning means to scan said tip of said micropipette in a plane parallel and close adjacent above said top surface whereby said data of interest output by said control logic means reflects the ion conductance of said top surface at the positions of said tip.
11 more elements
The method of operating a scanning ion conductance microscope to provide both topographic and ion conductance information about a sample comprising the steps of:
- (a) disposing the sample to be scanned in a reservoir containing an electrolyte covering the sample;
- (b) providing a micropipette having an open tip communicating with a hollow shaft;
- (c) disposing an electrolyte within the tip and shaft of the micropipette;
- (d) disposing a first microelectrode in the shaft in electrical contact with the electrolyte therein in non-contacting relationship with inner sidewalls of the shaft and the open tip;
- (e) disposing a second microelectrode in the reservoir in electrical contact with the electrolyte therein;
- (f) applying a voltage across the first and second microelectrodes and measuring the current flowing between the first and second microelectrodes through the open tip;
- (g) scanning the tip of the micropipette over a top surface of the sample in a scanning pattern with the tip of the micropipette at a distance above the top surface which will maintain the ion conductance between the first and second electrodes through the open tip at a constant value which will cause the tip to follow the top surface in close non-contacting proximity thereto while providing a z-directional component of the position of the tip of the micropipette;
- (h) outputting data of interest which reflects the topology of the top surface;
- (i) scanning the tip of the micropipette over a top surface of the sample in a scanning pattern with the tip of the micropipette in a plane parallel and close adjacent above the top surface;
- and,
- (j) outputting data of interest which reflects the ion conductance of the top surface at the positions of the tip.
8 more elements
Dependencies are inferred from the claim text.