Membrane probe with automatic contact scrub action
OwnerRichard E. Huff, Miklos Perlakiinventors
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OwnerRichard E. Huff, Miklos Perlakiinventors
Estimating the term…
An apparatus [10] for providing an automatic lateral scrubbing motion when a test membrane [22] engages a device under test (DUT) (not shown). Included are a fixed length flexure pivot assembly [30] and a pair of variable length flexure pivot assemblies [38]. Signal traces, signal trace terminals, and contact bumps [23, 25, 60] are formed for communicating electrical signals between the apparatus [10] and the DUT. A membrane [22] is stretched and configured for carrying the signal traces, signal trace terminals, and contact bumps [23, 25 and 60]. A hexagonal translation stage [28] is formed with an upper surface [29] disposed for being coupled to at lesat one of the fixed and variable length flexure pivot assemblies [30 and 38], and formed with a lower surface [54]. Surface [54] is formed to define an aperture [51] through itself, formed for securing over itself the membrane [22] when stretched; it is disposed for being coupled to membrane [22]. Finally included is a carrier [12], formed for suspending the hexagonal translation stage [28] and fixed and variable length flexure pivot assemblies [30 and 38].
An apparatus for providing an automatic lateral impingement scrubbing motion when a test membrane of a test probe engages a device under test (DUT), the apparatus comprising:
A membrane probe with automatic scrub action for abrading at least one oxide layer from an input/output pad of a device under test (DUT), the apparatus comprising:
Dependencies are inferred from the claim text.