Multilayer diffraction grating
AssigneeThe United States of America as represented by the Department of Energy
InventorTroy W. Barbee, Jr.
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AssigneeThe United States of America as represented by the Department of Energy
InventorTroy W. Barbee, Jr.
Estimating the term…
This invention is for a reflection diffraction grating that functions at X-ray to VUV wavelengths and at normal angles of incidence. The novel grating is comprised of a laminar grating of period D with flat-topped grating bars. A multiplicity of layered synthetic microstructures, of period d and comprised of alternating flat layers of two different materials, are disposed on the tops of the grating bars of the laminar grating. In another embodiment of the grating, a second multiplicity of layered synthetic microstructures are also disposed on the flat faces, of the base of the grating, between the bars. D is in the approximate range from 3,000 to 50,000 Angstroms, but d is in the approximate range from 10 to 400 Angstroms. The laminar grating and the layered microstructures cooperatively interact to provide many novel and beneficial instrumentational advantages.
An X-ray to VUV reflection multilayer diffraction grating, that comprises:
An X-ray to VUV reflection multilayer diffraction grating, that comprises:
A reflection multilayer diffraction grating as recited in claim 6, wherein the multiplicity of parallel grading bars have a grating period D in the approximate range from 3,000 to 50,000 Angstroms, and wherein any two adjacent microstructure layers have a combined thickness in the approximate range from 10 to 400 Angstroms.
Dependencies are inferred from the claim text.