Lapping control system for magnetic transducers

A lapping control system for accurately obtaining a desired element height of a batch fabricated magnetic transducer comprising:

• a row of the film magnetic transducers formed on a substrate, each comprising a magnetoresistive element having a height defining edge and two terminals;
• holding means comprising an elongated member having an H-shaped slot near one edge to form a beam member capable of being deflected in a substantially quadratic curvature;
• means for mounting said row on said beam member in a position to lap said height defining edge of each of said magnetoresistive elements;
• a plurality of pressure transducers, at least one of said pressure transducers being positioned to apply pressure to the beam member of said holding means;
• means for measuring the resistance of said magnetoresistive elements on said row as said row is being lapped;
• means responsive to the measured resistance values of said magnetoresistive elements to generate signals to control said pressure transducers for controlling lapping of the magnetoresistive elements;
• and
• means for terminating lapping when a predetermined element height is reached for said magnetoresistive elements.