Method and apparatus for comparing patterns
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorSeiichi Nakagawa
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AssigneeMatsushita Electric Industrial Co., Ltd.
InventorSeiichi Nakagawa
Estimating the term…
A method and apparatus for finding, by dynamic programing, combined patterns of standard patterns which are most similar to an input pattern by conducting a comparison collation between the input pattern expressed by a feature vector row and various combined patterns of memorized standard patterns expressed by feature vector rows corresponding to respective units of the words and the like to be recognized. In a dynamic programming calculation apparatus a comparison collation distance between a local pattern of the input pattern and an individual standard pattern is obtained, as a first step, by a method which is independent of a local length of the input pattern. Subsequently, as a second step, the comparison collation distance is converted into a quantity, which is independent of a length of the standard pattern, to obtain a distance between the comparison collation distance and various combined patterns of said standard patterns as a semioptimum value, thereby finding the combined patterns of said standard patterns which are most similar to said input pattern. Since in the dynamic programming calculation for the first step a weighting coefficient is determined so as to be dependent upon merely a standard pattern frame length, the result of a preceding calculation of a distance between vectors can be used in the following calculation, whereby overlapping calculations can be avoided.
A pattern comparing apparatus comprising;
A pattern comparing method comprising;
A pattern comparing method comprising;
A pattern comparing method comprising;
A pattern comparing method comprising:
A pattern comparing method comprising;
A pattern comparing method comprising;
Dependencies are inferred from the claim text.