Method and apparatus for extracting pattern contours in image processing
AssigneeFujitsu Limited
InventorsTakashi Toriu, Hiromichi Iwase
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AssigneeFujitsu Limited
InventorsTakashi Toriu, Hiromichi Iwase
Estimating the term…
This invention relates to a method and apparatus for extracting contour lines from a pattern obtained in image processing. The disclosed method and apparatus makes it possible to obtain the contour lines in real-time and, moreover, can be easily incorporated into hardware. To achieve these objects, a invention applies the simplified discrimination method for selecting pixels, which form the pattern contour, wherein each pixel is examined within groups of pixel, i.e. X-axis and Y-axis groups. The magnitude of a gray level gradient of each pixel is compared with those of neighboring pixels located in either direction of X-axis group or Y-axis. The pixel which has the maximum magnitude of gray level gradient among those of adjacent pixels is discriminated from each group as contour date. This discrimination method is simple and remarkably improved. When contour lines for two groups are combined, the pattern contours can be easily obtained.
A method of extracting pattern contours from an image formed by a plurality of pixels arranged in x and y coordinates, each pixel having a gray level graident, said method comprising the steps of:
An apparatus for extracting pattern contours from an image formed by a plurality of pixels arranged in X and Y coordinates, each pixel having a gray level gradient with a magnitude and direction, said apparatus comprising:
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