Apparatus for testing and sorting electronic components, in particular IC's
AssigneeMultitest Elektronische Systeme GmbH
InventorsHans-Heinrich Willberg, Ekkehard Ueberreiter, Franz Schottler
Life of this patent
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Abstract
An apparatus for testing and sorting electronic components (33), in particular IC's, is directly mounted on the mounting (2a, 2b to 10a, 10b), preferably forming part of a manipulator, for a test computer. In order to convey the components (33) between an input magazine (16), a testing head (20) and an output magazine (17) a suction head (20) is provided which is movable on a carriage guide (15) and which may be lowered. The mounting forming part of the manipulator permits the test computer (1) and the whole apparatus arranged on a slope so that the components (33) in the magazine rods (26) of the input magazine (16) and the output magazine (17) slide forwards under gravity.
Claims15
Apparatus for testing and sorting electronic components, comprising:
- an input magazine, with at least one magazine channel for the components to be tested,
- a testing head for the components to be individually tested one after another and having a socket with connection contacts,
- a test computer to supply test signals to the testing head for the components,
- an output magazine having at least one magazine channel for the components found to be sound and at least one magazine channel for the components found to be faulty, and
- a movable transfer element for transporting the components from the input magazine to the testing head and from the testing head to the output magazine, the moveable transfer element including,
- (i) a carriage guide, and
- (ii) a carriage mounted on the carriage guide for sliding movement therealong, first, to carry the electronic components to the testing head from the input magazine, and to connect the electronic components to the testing head to receive the test signals therefrom, and second, after each electronic component has received the test signals, to carry the electronic component to the output magazine from the testing head, and to deposit the electronic component in the output magazine.
Dependencies are inferred from the claim text.