High resolution interferometer with high etendue
AssigneeGTE Government Systems Corporation
InventorsDonald A. Leonard, Harold E. Sweeney
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Abstract
The etendue (throughput or area-solid angle product) of a high resolution interferometer is maintained at a substantially high level by use of a transparent chamber defined by a highly reflective internal surface, the chamber being located at the input to the interferometer. The chamber has an input aperture to admit light into the chamber and an output aperture or exit opening to pass light to the interferometer. By integrating the input light through multiple reflections thereof within the chamber until it exits to the interferometer, the etendue of the latter is substantially enhanced.
Claims7
In a Fabry-Perot interferometer comprising an etalon having an optical axis, a source of light on one side of said etalon and positioned to direct said light against said etalon, a lens on the side of said etalon opposite said one side and aligned with said optical axis, a mask traversing said axis at the focal plane of said lens, and optical utilizing means on the other side of said mask opposite from said lens, said mask having a light-transmitting portion adapted to pass light having a predetermined wavelength from said lens to said utilizing means, the improvement consisting of:
- a container having an internal light-reflecting chamber between said source and said one side of said etalon, said container having a reflective diffuse internal surface and an entrance aperture facing said source for admitting light into said container;
- said one side of said etalon being exposed to the interior of said container whereby light from said source reflected within said container is incident on said etalon.
Dependencies are inferred from the claim text.