Voltage mapping device having fast time resolution
AssigneeHamamatsu Photonics K. K.
InventorsHironori Takahashi, Shinichiro Aoshima, Yutaka Tsuchiya
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Abstract
A voltage detecting device for detecting voltages in an object under test including an electro-optic material covering a plurality of parts of the object under test; the refractive index of the electro-optic material being variable according to an applied voltage. A light source emits light through the electro-optic material toward the object under test and a detecting device receives an emergent light beam reflected from within the electro-optic material in order to detect voltages in the object. Further, a scanning device automatically scans the object under test with the light beam in order to detect voltages at a plurality of locations on the object.
Claims5
A voltage detecting device for detecting voltages in an object to be measured, comprising:
- an electro-optic material for covering a plurality of positions of the object to be measured, and having a refractive index which varies according to a voltage applied thereto;
- a light source for emitting a light beam through said electro-optic material toward the oojecr ro oe measured;
- scanning means, including deflective means for deflecting said light beam emitted by said light source over a plurality of parts on said electro-optic material corresponding to said plurality of positions of the object to be measured;
- and
- detecting means for receiving an emergent light beam from said electro-optic material and detecting voltages at said plurality of positions of the object to be measured according to changes in polarization of said emergent light beam caused by changes in said refractive index of said electro-optic material.
Dependencies are inferred from the claim text.