Logic module for generating unequiprobable/random patterns for integrated circuits
AssigneeSiemens Aktiengesellschaft
InventorsDetlef Schmid, Hans-Joachim Wunderlich
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AssigneeSiemens Aktiengesellschaft
InventorsDetlef Schmid, Hans-Joachim Wunderlich
Estimating the term…
For assisting the self-test of circuits with unequiplebable random patterns, a logic module is provided which is composed of two types of basic cells. Each basic cell contains a register cell and a sub-circuit composed of gates. Dependent on two control signals, the basic cells can be operated as a normal register, as a shift register or as a linear feedback shift register. In the operational mode as a linear feedback shift register, the logic module can be used as a random pattern generator. To this end, the logic module is divided into a first module and into a second module. The first module contains an interconnection of two types of basic cells and a combinational logic system which operates the one part of the output signals of the basic cell in accordance with a Boolean function. The operational result is supplied to a second module of identical basic cells which operates as a shift register. When a random bit sequence is input into the first module, then all basic cells of the linear feedback shift register are a logical "1" with the probability of 0.5. Following the operation of a portion of the output signals of the basic cells in the combinational logic system, a bit sequence is shifted into the second module, the bit places of this bit sequence being a logical "1" with a probability determined by the Boolean function.
A logic system for generating an unequiprobable random bit pattern for supporting the self-test of integrated circuits comprising:
Dependencies are inferred from the claim text.