Method of and apparatus for reducing current of semiconductor memory device
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorTakayuki Miyamoto
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Abstract
A circuit (50) is provided in a dynamic RAM (1) for detecting establishment of a substrate bias voltage (V.sub.BB) when the power is first turned on. A NAND gate (5d) in a clock generator circuit (10) immediately applies a high level signal to an inner circuit (11) when the power is turned on. Successively, the NAND gate (5d) applies a RAS signal to the inner circuit (11) in response to the establishment of V.sub.BB. Therefore, the dynamic RAM (1) is brought to a standby state immediately after the power is turned on and thereafter is controlled by the RAS signal. Consequently, flow of excessive current and latch-up immediately after the power is turned on can be prevented.
Claims11
A semiconductor memory device (1) formed on a semiconductor substrate operative in a first operating state and a second operating state, wherein said memory device (1) consumes more current in said first operating state than in said second operating state, said scmiconductor device (1) comprising:
- at least one memory cell for storing data;
- control means (11) responsive to an external control signal for controlling said memory device (1) to operate selectively in said first and second operating states;
- power detector means (57) for detecting an application of power to said memory device;
- pseudo state signal generating means (58) responsive to said power detector means (57) for generating a pseudo state signal defining said second operating state of said memory device (1);
- substrate bias voltage generating means (29) receiving a power for generating a bias voltage to be applied to said substrate;
- wherein said memory device (1) operates normally when a voltage of a prescribed level is applied to said substrate from said substrate bias voltage generating means (29),
- voltage establishment detector means (50, 58) detecting that the voltage generated by said substrate bias voltagc generating means (29) is established in said prescribed level;
- and
- switching means (59) responsive to said voltage establishment detector means (50, 58) for selectively applying either an externally applied control signal or a signal from said pseudo state signal generating means (58) to said control means (11), wherein
- said control means (11}controls said memory device (1) to operate in said second operating state in response to said applied pseudo state signal.
A dynamic random access memory device (1) formed on a semiconductor substrate operative in a first operating state and a second operating state, wherein said memory device (1) consumes small current in said first operating state than in said second operating state, said dynamic random access memory device (1) comprising:
- at least one memory cell for storing data;
- control means (11) responsive to an external control signal for controlling said memory device (1) to operate selcctively in said first and second operating states;
- power detector means (57) for detecting an application of power to said memory device (1);
- pseudo state signal generating means (58) responsive to said power detector means (57) for generating a pseudo state signal defining said second operating state of said memory device (1);
- substrate bias voltage generating means (29) receiving a power for generating a bias voltage to be applied to said substrate;
- wherein said memory device (1) operates normally when a voltage of a prescribed level is applied to said substrate from said substrate bias voltage generating means (29),
- voltage establishment detector means (50, 58) detecting that the voltage generated by said substrate bias voltage generating means (29) is established in said prescribe level;
- and
- switching means (59) responsive to said voltage establishment detector means (50, 58) for selectively applying either an externally applied control signal or a signal from said pseudo state signal generating means (58) to said control means (11), wherein
- said control means (11) controls said memory device (1) to operate in said second operating state in response to said applied pseudo state signal.
A method for operating a semiconductor memory device (1) formed on a semiconductor substrate and operative in a first operating state and a second operating state, wherein said memory device (1) consumes more current in said first operating state than in said second operating state, said device (1) comprising:
- at lease one memory cell for storing data;
- control means (11) responsive to an external control signal for controlling said memory device (1) to operate selectively in said first and second operating states;
- and
- substraste bias voltage generating means (29) receiving power for generating bias voltage to be applied to said substrate;
- wherein
- said memory device (1) operates normally when a voltage of a prescribed level is applied from said substrate bias voltage generating means (29) to said substrate:
- said method comprising the steps of:
- detecting an application of power to said memory device(1);
- generating responsive to an application of power a pseudo state signal defining said second operating state of said memory device (1);
- detecting that the voltage generated by said substrate bias voltage generating means is established in said prescribed level;
- selectively applying responsive to said voltage establishment detector means (50, 58) either an external control signal or said pseudo state signal to said control means (11);
- and
- controlling said control means (11) to operate said memory device (1) in said second operating state in response to said applied pseudo state signal.
A method for operating a dynamic random access memory devicc (1) formed on a semiconductor substrate and operative in a first operating state and a second operating state, wherein said memory device (1) consumes more current in said first operating state than in said second operating state, said device (1) comprising:
- at lease one memory cell for storing data;
- control means (11) responsive to an eternal control signal for controlling said memory device (1) to operate selectively in said first and second operating states;
- and
- substrate bias voltage generating means (29) receiving power for generating bias voltage to be applied to said substrate;
- wherein
- said memory device (1) operates normally when a voltage of a prescribed level is applied from said substrate bias voltage generating means (29) to said substrate:
- said method comprising the steps of:
- detecting an application of power to said memory device (1);
- generating responsive to an application of power pseudo state signal defining said second operating state of said memory device (1);
- detecting that the voltage generated by said substrate bias voltage generating means is established in said prescribed level;
- selectively applying responsive to said voltage establishment detector means (50, 58) either an external control signal or said pseudo state signal to said control means (11);
- and
- controlling said control means (11) to operate said memory device (1) in said second operating state in response to said applied pseudo state signal.
Dependencies are inferred from the claim text.