Semiconductor integrated circuit having a DC test function

An integrated circuit receiving an input signal and producing output signal comprising:

• an internal main circuit for carrying out various logic operations in accordance with the input signal and producing a first signal and second signal;
• a set/reset circuit, operatively connected to said internal main circuit, being set in response to the first signal and reset in response to the second signal in a normal mode;
• an output buffer circuit, connected to said set/reset circuit, for producing the output signal in response to an output of said set/reset circuit;
• and
• a control circuit, connected between said internal main circuit and said set/reset circuit, receiving the first signal, a reset signal for initializing said internal main circuit, the first signal, the second signal, and a first test signal, during a DC test mode, said control circuit resetting said set/reset circuit in response to a receipt of the reset signal regardless of the second signal and setting said set/reset circuit in response to a receipt of the first test signal regardless of the reset signal and the first signal.