Method for generating extremely short ion pulses of high intensity from a pulsed ion source
OwnerRaimund Grix, Roland Kutscher +2inventors
InventorsRaimund Grix, Roland Kutscher, Gang Q. Li, Hermann Wollnik
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OwnerRaimund Grix, Roland Kutscher +2inventors
InventorsRaimund Grix, Roland Kutscher, Gang Q. Li, Hermann Wollnik
Estimating the term…
In a method for generating extremely short ion pulses having a high intensity and a pulsed ion source to generate extremely short ion pulses having a high intensity, the ions are generated by an electron, laser or particle beam and are stored in a potential well formed by at least three electrodes, at least one of the central electrodes having a more attractive potential for the ions in question than the other electrodes. A single electrical pulse is used for extracting the ions from the potential well. Correspondingly constructed pulsed ion sources are particularly suitable for use in time-of-flight mass spectrometry. The ion storage effect is produced by a number of electrodes which generate a potential well for the ions to be detected. The ion compression is determined by the field strength existing during the ion extraction in the ion source which should be approximately equal in the entire area of acceleration.
A method for generating ion pulses for a time-of-flight mass spectrometer where an ion source generates ions by an electron, laser, or particle beam comprising the following steps:
A pulsed ion source for time-of-flight spectrometer having a device for emission of an electron, laser or particle beam for generating ions in an ionization volume and forming an ion source and where ions are extracted from the ionization volume by an electrical pulse characterized by the following:
Dependencies are inferred from the claim text.