Apparatus for self checking of functional redundancy check (FRC) logic
AssigneeIntel Corporation
InventorsDavid B. Johnson, Mark S. Myers, Eileen Riggs
Life of this patent
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AssigneeIntel Corporation
InventorsDavid B. Johnson, Mark S. Myers, Eileen Riggs
Estimating the term…
An integrated circuit module (200) in which an error detection circuit (234, 263) compares data (204) generated internally on module (200) with data (108) generated externally from another substantially identical module (100). An error detect output (238) is asserted upon the condition that data (204) generated internally on module (200) and data (108) generated externally from module (100) do not match. A circuit (222, 224) alters the internally generated data (204) by injecting erroneous data into the internally generated data (204) to thereby generate altered data (230). Error anticipation control logic (210) generates a test condition (214, 216), which corresponds to the expected error condition caused by altered data. Comparison circuit (242) compares the actual error detect output (238, 240) with expected error detect output (214, 215). An error output (244) is asserted if the actual error detect output (238, 240) and the expected error detect output (214, 216) do not match.
In an integrated circuit module (200) in which an error detection circuit (236) compares data (204) generated internally on said module (200) with data (108) generated externally from another substantially identical module (100) to thereby assert an error detect output (240) upon the condition that said data (204) generated internally on said module (200) and said data (108) generated externally from said other module (100) do not match, the improvement comprising:
Dependencies are inferred from the claim text.