Apparatus for measuring noise characteristics
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorOsamu Ishikawa
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Abstract
A device for measuring characteristics of a semiconductor device using a noise measurement system and an impedance measuring system includes an input probe and an output probe for providing connection to the semiconductor device. The device also includes first and second variable impedance devices for respectively varying a source and a load impedance, and respectively connected to the input and output probing devices. First and second switching devices are respectively connected to the first and second variable impedance devices. The switching devices selectively connect the first and second variable impedance devices to the noise measurement system, and selectively connect the first and second variable impedance devices to the impedance measuring system.
Claims9
A system for measuring characteristics of a semiconductor device using a noise measuring system and an impedance measuring system, said system comprising:
- an input probing means and an output probing means for providing connection to the semiconductor device;
- first and second variable impedance means for respectively varying a source and a load impedance, and respectively connected to said input probing means and said output probing means;
- first and second switching means respectively connected to said first and second variable impedance means and each having means for connection to the noise measuring system and the impedance measuring system, said first and second switching means for selectively connecting said first and second variable impedance means to one of the noise measuring system and the impedance measuring system.
Dependencies are inferred from the claim text.