Surface inspection apparatus using a mask system to monitor uneven surfaces
AssigneeHajime Industries Ltd.
InventorYoshida Hajime
Life of this patent
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Abstract
A surface inspection apparatuses having a light source for irradiating an uneven surface of an object to be inspected, a photoelectric conversion sensor for picking up the uneven surface of the object and generating a video signal thereof, and an electronic processor for processing the video signal to inspect the surface of the object, in which an optical mask is located in front of the light source so as to restrict the passage of the light from the light source with a predetermined pattern, whereby the irregular light reflection of the light from the light source, which passed through the optical mask, on the uneven surface becomes substantially uniform.
Claims9
A surface inspection apparatus comprising:
- (a) a light source for irradiating an uneven surface of an object to be inspected;
- (b) a photoelectric conversion sensor for picking up the uneven surface of the object and generating a video signal thereof;
- (c) an electronic processor for processing the video signal to inspect the surface of the object;
- (d) an optical mask formed of two opaque portions and two transparent portions which are arranged alternately around the center of the optical mask, the two opaque portions being symmetrical to each other with respect to the center of the optical mask, the two transparent portions being also symmetrical to each other with respect to the center of the optical mask, said optical mask being located in front of the light source with the center of the former being coincident with the optical axis of the light source;
- (e) light splitting means for dividing the light passed through the optical mask into two directions intersecting at substantially 90 degrees;
- and
- (f) two light reflecting means for respectively reflecting thereon the lights from the light splitting means in such a manner that reflected lights intersect each other at substantially 90 degrees at the center of the surface of the object so that irregular light reflection on the uneven surface becomes substantially uneven.
A surface inspection apparatus comprising:
- (a) two light sources each for obliquely irradiating an uneven surface of an object to be inspected from its upper side, said two light sources are located such that their optical axes cross each other at a substantially right angle at the center of the surface of said object;
- (b) a photoelectric conversion sensor for picking up the uneven surface of the object and generating a video signal thereof;
- (c) an electronic processor for processing the video signal to inspect the surface of the object;
- and
- (d) an optical mask located in front of each of the two light sources and for restricting the passage of the light from each of the light sources in such a manner that the light passed through the optical mask located in front of one of the light sources irradiate the surface of the object except for two surface portions thereof which are substantially the same in shape, symmetrical with respect to the optical axis of the other light and an angle of each of the two surface portions at the center of the surface of the object is substantially 90 degrees with the optical axis of the one light source as the center, whereby the irregular light reflection on the uneven surface becomes substantially uniform.
Dependencies are inferred from the claim text.