Surface inspecting apparatus
AssigneeFuji Photo Film Co., Ltd.
InventorsIppei Takahashi, Akihisa Iida
Life of this patent
Estimating the term…
Abstract
An apparatus for inspecting the surface of web material moving lengthwise at a constant speed by scanning the surface in the direction of the width of the surface with a light beam. The scanned beam modulated by the surface is received and converted into an electric signal which is divided into division signals representing divisions of the width of the web. A first memory capability is provided for storing division signals added together by division every N transverse scans. The added division signals are transferred to a second memory capability by division, for evaluating the surface defect distribution of the scanned surface division by division.
Claims4
An apparatus for inspecting a surface of a continuously running web material by repeatedly scanning the surface in the direction of the width of said web material with a light beam, said surface modulating said light beam, said apparatus comprising:
- light receiving means for receiving modulated light from said web material to provide division signals representing division of the width of the web into portions for each scan;
- first memory means for adding together and storing therein said division signals for each scan in synchronism with said scanning;
- second memory means for storing said added division signals by width portion;
- switching means for connecting said first memory means to said second memory means to transmit said added division signals from said first to said second memory means after a predetermined number of scans has been effected;
- and
- means for reading out said added division signals by width portion from said second memory means, thereby to give an indication of surface defects on each said portion of said surface of said web material being evaluated.
Dependencies are inferred from the claim text.