Contactor assembly for testing integrated circuits
AssigneeDaymarc Corporation
InventorNicholas J. Cedrone
Life of this patent
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AssigneeDaymarc Corporation
InventorNicholas J. Cedrone
Estimating the term…
A contactor assembly interconnects a surface mount integrated circuit device under test (DUT) with a test circuit. The assembly includes a main contact block with a central opening, a plug that mounts in the opening, and contact assemblies carried on the plug that each have contacts, a ground plane, and an insulating layer therebetween. Alignment pins locate the contact assemblies on the plug and other pins locate the plug within the contact block opening. The upper end of the contacts, cooperating with the plug, project freely toward a contact plane where they connect with associated pins of the DUT. The lower end of the plug simulates the DUT for insertion into a socket on the test circuit. Laterally adjustable conductive clips connect each ground plane to a ground member connected to the test circuit and located around the socket. In the preferred form, a rectangular frame of an insulating material surrounds the DUT-simulating portion of the plug and clamps pairs of these adjustable clips, one of which resiliently abuts the lower end of the ground plane of the associated contact assembly, and the other of which resiliently bears against the ground member.
A contactor assembly for electrically connecting pins of an electronic device under test (DUT) at a contact plane to a test circuit separated from the contact plane along a first direction perpendicular to the contact plane when the DUT is positioned over the contactor assembly at the contact plane generally orthogonal to the first direction, the DUT moving under automatic control and at a high rate along said first direction to said contact plane comprising:
In a contactor assembly for electrically connecting pins of an electronic device under test (DUT) to a test circuit separated from a contact plane along a first direction, the contactor assembly having a plurality of conductive contacts that flex resiliently between a first position where said contacts are clear of said pins and a second position where said contacts are in electrical connection with an associated one of said pins at a free end of said contact, the improvement comprising means for mounting an electronic circuit device in a closely spaced relationship to the DUT when it is at the contact plane during test and in electrical connection with at least a pair of selected pins of the DUT, comprising:
Dependencies are inferred from the claim text.