Fabrication of silicon structures by single side, multiple step etching process
OwnerWilliam G. Hawkinsinventor
Life of this patent
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Abstract
Three dimensional silicon structures are fabricated from (100) silicon wafers by a single side, multiple step ODE etching process. All etching masks are formed one on top of the other prior to the initiation of etching, with the coarsest mask formed last and used first. Once the coarse anisotropic etching is completed, the coarse mask is removed and the finer anisotropic etching is done. The preferred embodiment is described using a thermal ink jet channel plate as the three dimensional structure, where coarse etching step provides the reservoir and the fine etching step provides the ink channels.
Claims7
A method for fabricating a three dimensional structure from a silicon wafer whose surface is specifically oriented with respect to the (100) and (110) crystal planes of the wafer comprising the steps of:
- (a) forming a first layer of etch resistant material on both side surfaces of the wafer;
- (b) patterning the first layer of etch resistant material on one of the wafer surfaces to produce a plurality of precisely located vias therein for subsequent orientation dependent etching (ODE) of recesses, so that said recesses will be bounded by walls lying along the {111}planes of the wafer;
- (c) depositing a second layer of etch resistant material on both sides of the wafer and over the first layer of etch resistant material, including the via therein;
- (d) patterning the second layer of etch resistant material on the same side as patterned on the first layer of etch resistant material to produce at least one via within the boundary of one or each of the vias in said first layer of etch resistant material for production of relatively deep recesses in the wafer by ODE;
- (e) placing the wafer into an anisotropic etchant medium to produce relatively deep coarse recesses in the wafer through the vias in the second layer of etch resistant material;
- (f) removing the second layer of etch resistant material;
- and
- (g) replacing the wafer into the anisotropic etchant medium to produce relatively shallow, fine recesses in the wafer through the vias in the first layer of etch resistant material.
Dependencies are inferred from the claim text.